ELECTRONIC EQUIPMENT, METHOD FOR TESTING THE SAME, AND SEMICONDUCTOR DEVICE

摘要

PROBLEM TO BE SOLVED: To provide an electronic equipment capable of exactly testing an open or a short-circuit test between semiconductor devices without increasing a circuit area. SOLUTION: The electronic equipment is constituted by connecting a CPU 100 to a memory 30 through bus lines DB1 to DBn. The CPU 10 has a data output unit 11 for outputting data DATA to the lines DB1 to DBn, and a data comparator 12 for comparing the data DATA with data DATA obtained by inverting a logic input from the memory 30 through the lines DB1 to DBn to output a decision signalϕJDG based on its compared result. The memory 30 has a latching unit 31 for latching the data DATA from the unit 11, and a logic unit 32 for inverting a logic of the latched data DATA to output the inverted data DATA. The CPU 10 decides non-defective or defective of a connection of the CPU 10 to the memory 30.