| 摘要 |
PROBLEM TO BE SOLVED: To accurately detect a defect without being affected by the difference in the illuminance of an inspection target, to detect the inspection target to be carried without stopping temporarily, and to detect a plurality of types of inspection targets, without registering the normal images of the plurality types of inspection targets for the plurality of types of inspection targets and without discriminating the types of the targets to be inspected. SOLUTION: Images of a first region S1 and a second region S2 on the surface of an inspection target (aluminum foil affixed to the reverse side of the blister pack of a tablet) 1-1 are fetched. Then, the fetched images are compared by the phase limitation correlation method (Fourier transform to synthesis to phase limitation to inverse Fourier transform and to calculation of correlation values), thus determining whether a defect is generated on the surface of the inspection target 1-1 based on a correlation value being obtained in the comparison process. |
