| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor tester capable of suppressing a reduction in number of simultaneous tests of a device to be measured to a minimum limit even in the case that number of input and output terminals of the device is more that of the terminals of a measuring circuit block of the tester. SOLUTION: The semiconductor tester having a plurality of measuring circuit blocks provided for a plurality of devices 3 to be measured to be able to simultaneously test the plurality of the devices 3 comprises an arithmetic circuit 6 inputting all outputs of the plurality of the blocks to calculate decided results of the devices 3.
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