发明名称 METHOD FOR INSPECTING RIB OMISSION OF COLOR FILTER SUBSTRATE WITH RIB
摘要 PROBLEM TO BE SOLVED: To precisely and easily detect omission of a rib and to rapidly judge whether a color filter substrate is normal or defective by comparing the color pattern data containing a rib with the color pattern data not containing the rib in the vicinity from the inputted image data and detecting only the rib. SOLUTION: The image of the color pattern 10 image picked up by a CCD camera 1 is sent to a detection part 6, and a detection signal in the main scan direction X is sent answering to the sub-scan direction Y of the color pattern 10. This detection signal outputs a waveform according to its height when the rib exists on the color pattern 10, and the detection signal of a defective projection of a foreign matter, etc., appears irregularly and variously in its size also. By performing this signal the comparison processing with the pitch delayed signal of the color pattern in a comparison processing part 7, only a rib signal is extracted. Then, the image of the rib is made one point in a contraction processing part 8. The data not becoming one point at that time are omitted as a defect larger than the rib.
申请公布号 JP2000221514(A) 申请公布日期 2000.08.11
申请号 JP19990063787 申请日期 1999.02.03
申请人 TAKANO CO LTD 发明人 TODA YOSHIMI
分类号 G06T1/00;G01N21/95;G01N21/956 主分类号 G06T1/00
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