发明名称 MICRO MANIPULATION DEVICE FOR FINE WORK AND MICRO PROBE FOR FINE WORK
摘要 PROBLEM TO BE SOLVED: To provide a micro manipulation device and a micro probe for the microfabrication of a microscope by which a processing part is precisely specified and made easy to be observed as a microscope image and extremely fine sample processing is easily executed in an optimum processing direction. SOLUTION: This micro manipulation device for microfabrication is constituted as follow. An inspection processing sample stage 2 which is used for placing an inspection processing sample 3 and which can be optionally moved in an X axis direction and in a Y axis direction and driven to be rotated with the optical axis A-A' of a microscope 10 as a rotation center is installed on a movable base 1 which can be optionally moved in the X axis direction and in the Y axis direction and driven to be inclined and rotated with the B-B' axis of the surface of the sample 3 as a rotation center. Besides, a manipulator base 5 on which a manipulator driving unit 7 is loaded through a manipulator base supporting body 4 and which can be driven to be rotated with the optical axis A-A' of the microscope 10 as a rotation center is installed on the base 1. Then, the probe for fine work is fitted to the tip of the unit 7.
申请公布号 JP2000221409(A) 申请公布日期 2000.08.11
申请号 JP19990025155 申请日期 1999.02.02
申请人 SANYU SEISAKUSHO:KK;YAMAMOTO YOSHIO 发明人 KATOGI KATSUYA;KAWAKAMI TATSUO;YAMAMOTO YOSHIO;EDA HIROSHI
分类号 B25J7/00;G02B21/00;G02B21/32;(IPC1-7):G02B21/32 主分类号 B25J7/00
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