发明名称 JITTER MEASURING DEVICE AND METHOD
摘要 <p>Jitter measuring device including a Hilbert pair generator (11) for transforming a measured signal into an analysis signal of complex number, a momentary phase estimator (12) for estimating the momentary phase of the analysis signal, a linear phase eliminator (13) for determining the phase noise waveform by subtracting the linear phase from the momentary phase, and a peak-to-peak detector (14) for determining the RMS jitter and the peak jitter from the phase noise waveform, and a mean square detector (15).</p>
申请公布号 WO2000046606(P1) 申请公布日期 2000.08.10
申请号 JP2000000644 申请日期 2000.02.07
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