| 摘要 |
<p>A method is provided for accurately screening monolithic ceramic capacitors to reject those having internal defects. A constant direct current (4) is supplied between the external electrodes (6) of a monolithic ceramic capacitor (1) having defects (12) in its effective dielectric layer (8). When the voltage between the external electrodes (6) is increased and a voltage curve (11) becomes flat, the constant direct current (4) is further supplied for a predetermined time. If the voltage between the external electrodes (6) abruptly falls during the predetermined time, the capacitor is rejected as defective.</p> |
