| 摘要 |
<p>To measure characteristics of output elements 4-6 of a semiconductor device 1, the device is provided with a measurement terminal P10 for measuring the voltage (electric potential) at the terminals of the output elements 4-6 connected to a control circuit 3 of the device, in addition to the terminals for the output elements 4-6. Each of the output elements is connected with the measurement terminal P10 via an switching element SW1-SW4 which is selectively turned ON/OFF to read the voltage at the terminal selected by measurement data fed to the decoder. By the use of the single measurement terminal P10, the invention permits accurate measurements of characteristics of the output elements irrespective of the contact and ohmic wiring resistances involved in the measurements, without any further terminals for the measurements. <IMAGE></p> |
