发明名称 Contact process using Y-contact etching
摘要 A method is disclosed for forming Y-shaped holes in semiconductor substrates by using Y-contact etching. The hole is formed with a single, two-step dry-etching process in a single chamber with one masking step for the whole hole. The upper portion of the Y-shaped hole is formed by means of an isotropic tapered dry-etching process while the lower portion is formed by means of a straight anisotropic recipe of the same dry-etching process. The result is a Y-shaped hole formed with fewer process steps and with maximized contact area for improved reliability.
申请公布号 US6100577(A) 申请公布日期 2000.08.08
申请号 US19990377542 申请日期 1999.08.19
申请人 VANGUARD INTERNATIONAL SEMICONDUCTOR CORPORATION 发明人 LINLIU, KUNG
分类号 H01L21/311;H01L21/768;(IPC1-7):H01L39/00 主分类号 H01L21/311
代理机构 代理人
主权项
地址