发明名称 Sputtering process for the conformal deposition of a metallization or insulating layer
摘要 The present invention is a method related to the deposition of a metallization layer in a trench in a semiconductor substrate. The focus of the invention is to sequentially perform heated deposition and etch unit processes to provide a good conformal film of metal on the inner surfaces of a via or trench. The deposition and etch steps can also be performed simultaneously.
申请公布号 US6100200(A) 申请公布日期 2000.08.08
申请号 US19980218563 申请日期 1998.12.21
申请人 ADVANCED TECHNOLOGY MATERIALS, INC. 发明人 VAN BUSKIRK, PETER C.;RUSSELL, MICHAEL W.;VESTYCK, DANIEL J.;SUMMERFELT, SCOTT R.;MOISE, THEODORE S.;CELII FRANCIS G
分类号 C23C14/04;C23C14/34;H01L21/02;H01L21/285;H01L21/768;(IPC1-7):H01L21/311 主分类号 C23C14/04
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