发明名称 Compound switching matrix for probing and interconnecting devices under test to measurement equipment
摘要 A compound switching matrix (30) operates in cooperation with a resistance measuring system (20) and a laser (22) to quickly and accurately trim resistors (12) to predetermined values while they are being measured. The compound switching matrix is implemented with dry reed relays (34-81, 101-164) and includes a probe switching matrix (90-97) and a configuration matrix (32) that reduce the average number of relay contacts required per probe to implement two-, three-, and four-terminal measurements with or without guarding. Moreover, the separate probe switching and measurement configuration matrices effectively separate the high and low sides of the measurement to reduce the effects of stray resistances and capacitances on measurement speed and accuracy. A switchable grounding configuration (82-89) further improves measurement accuracy. The compound switching matrix of this invention enables sequential resistance measurements of individual resistors in the array, with two-, three-, and four-terminal measurement configurations being adapted to resistors having values ranging from less than 0.1 ohm to greater than 100 Megohms.
申请公布号 US6100815(A) 申请公布日期 2000.08.08
申请号 US19970998156 申请日期 1997.12.24
申请人 ELECTRO SCIENTIFIC INDUSTRIES, INC. 发明人 PAILTHORP, ROBERT M.
分类号 G01R31/00;G01R1/073;H01C17/22;H01C17/242;H01H47/00;H01H67/24;H01H67/30;(IPC1-7):H04Q19/00 主分类号 G01R31/00
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