发明名称 |
InP-based HEMT with superlattice carrier supply layer |
摘要 |
A semiconductor device includes a semi-insulating substrate. A channel layer is formed on the semi-insulating substrate. An electron supply layer is formed on the semi-insulating substrate for generating a two-dimensional electron gas. The electron supply layer includes a doped superlattice layer. The superlattice layer includes layers of InXAl1-XAs and layers of InYAl1-YAs which alternate with each other, where 0</=X</=1.0 and 0</=Y</=1.0, and X differs from Y.
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申请公布号 |
US6100542(A) |
申请公布日期 |
2000.08.08 |
申请号 |
US19970974731 |
申请日期 |
1997.11.19 |
申请人 |
DENSO CORPORATION |
发明人 |
KOHARA, TERUAKI;HOSHINO, KOICHI;TAGUCHI, TAKASHI |
分类号 |
H01L29/06;H01L21/338;H01L29/15;H01L29/778;H01L29/812;(IPC1-7):H01L29/267;H01L29/205 |
主分类号 |
H01L29/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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