发明名称 InP-based HEMT with superlattice carrier supply layer
摘要 A semiconductor device includes a semi-insulating substrate. A channel layer is formed on the semi-insulating substrate. An electron supply layer is formed on the semi-insulating substrate for generating a two-dimensional electron gas. The electron supply layer includes a doped superlattice layer. The superlattice layer includes layers of InXAl1-XAs and layers of InYAl1-YAs which alternate with each other, where 0</=X</=1.0 and 0</=Y</=1.0, and X differs from Y.
申请公布号 US6100542(A) 申请公布日期 2000.08.08
申请号 US19970974731 申请日期 1997.11.19
申请人 DENSO CORPORATION 发明人 KOHARA, TERUAKI;HOSHINO, KOICHI;TAGUCHI, TAKASHI
分类号 H01L29/06;H01L21/338;H01L29/15;H01L29/778;H01L29/812;(IPC1-7):H01L29/267;H01L29/205 主分类号 H01L29/06
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