发明名称 Mixed frequency CVD apparatus
摘要 A substrate processing system that includes a ceramic substrate holder having an RF electrode embedded within the substrate holder and a gas inlet manifold spaced apart from the substrate holder. The gas inlet manifold supplies one or more process gases through multiple conical holes to a reaction zone of a substrate processing chamber within the processing system and also acts as a second RF electrode. Each conical hole has an outlet that opens into the reaction zone and an inlet spaced apart from the outlet that is smaller in diameter than said outlet. A mixed frequency RF power supply is connected to the substrate processing system with a high frequency RF power source connected to the gas inlet manifold electrode and a low frequency RF power source connected to the substrate holder electrode. An RF filter and matching network decouples the high frequency waveform from the low frequency waveform. Such a configuration allows for an enlarged process regime and provides for deposition of films, including silicon nitride films, having physical characteristics that were previously unattainable.
申请公布号 US6098568(A) 申请公布日期 2000.08.08
申请号 US19970980520 申请日期 1997.12.01
申请人 APPLIED MATERIALS, INC. 发明人 RAOUX, SEBASTIEN;MUDHOLKAR, MANDAR;TAYLOR, WILLIAM N.;FODOR, MARK;HUANG, JUDY;SILVETTI, DAVID;CHEUNG, DAVID;FAIRBAIRN, KEVIN
分类号 H05H1/46;C23C16/505;C23C16/509;C23C16/517;H01J37/32;H01L21/31;(IPC1-7):C23C16/00 主分类号 H05H1/46
代理机构 代理人
主权项
地址