| 摘要 |
PURPOSE: An apparatus for testing a semiconductor device is provided to improve productivity and durability for automatization by preventing an intermediate board and a socket from being broken by pressing power. CONSTITUTION: In an apparatus for testing a semiconductor device in which a unit element socket(8) is connected to a main board(1) of a personal computer(PC) through an intermediate board and the semiconductor device to test is inserted into the unit element socket, the computer main board in which a memory module socket is eliminated and a connector pin(2) is mounted, is fixed to the PC supporting element(3) so that a back side of the main board faces upward. The intermediate board is electrically connected on the connector(4) and a receptacle(10) is formed on the intermediate board while a plurality of unit element sockets and the unit element socket pin(9) are inserted into the receptacle. A unit element socket supporting element(11) having a plurality of socket holes(11) is disposed on the intermediate board, so that the intermediate board is fixed and supported in the socket supporting element, and supports the unit element socket which is inserted into the receptacle of the intermediate board through the socket hole.
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