发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE HAVING STRUCTURE OF DUAL GATE |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device having a structure of a dual gate is provided to protect a semiconductor substrate by preventing a gate oxidation layer from being deteriorated by penetration of a boron. CONSTITUTION: A method for manufacturing a semiconductor device having a structure of a dual gate comprises the steps of: forming a first insulation layer on a semiconductor substrate; forming a second insulation layer on the first insulation layer by a chemical vapor deposition(CVD) method; performing a heat treatment after ion-injecting a nitrogen to the resultant, and having the nitrogen file up in the boundary between the first insulation layer and the semiconductor substrate; eliminating the first and second insulation layers; and forming a gate insulation layer on the resultant.
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申请公布号 |
KR20000050488(A) |
申请公布日期 |
2000.08.05 |
申请号 |
KR19990000410 |
申请日期 |
1999.01.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KANG, MAN SEOK |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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