发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE HAVING STRUCTURE OF DUAL GATE
摘要 PURPOSE: A method for manufacturing a semiconductor device having a structure of a dual gate is provided to protect a semiconductor substrate by preventing a gate oxidation layer from being deteriorated by penetration of a boron. CONSTITUTION: A method for manufacturing a semiconductor device having a structure of a dual gate comprises the steps of: forming a first insulation layer on a semiconductor substrate; forming a second insulation layer on the first insulation layer by a chemical vapor deposition(CVD) method; performing a heat treatment after ion-injecting a nitrogen to the resultant, and having the nitrogen file up in the boundary between the first insulation layer and the semiconductor substrate; eliminating the first and second insulation layers; and forming a gate insulation layer on the resultant.
申请公布号 KR20000050488(A) 申请公布日期 2000.08.05
申请号 KR19990000410 申请日期 1999.01.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG, MAN SEOK
分类号 H01L21/336;(IPC1-7):H01L21/336 主分类号 H01L21/336
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