发明名称 |
MOS TRANSISTOR WITH ELEVATED SOURCE/DRAIN STRUCTURE AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A MOS transistor and a manufacturing method thereof are to provide the MOS transistor having an elevated source/drain structure for preventing junction leakage current. CONSTITUTION: A MOS transistor comprises: a gate(108) on a semiconductor substrate(102) surrounded by a first spacer(110) with a gate oxide film(106) intervening therebetween; a source/drain(116) formed on the surface of the substrate at both sides of the gate; a metal silicide layer(102s) formed on the gate and the source/drain; and a second spacer(118) formed at the side walls of the metal silicide layer and on the surface of the first space. A manufacturing method thereof comprise the steps of: forming the gate on the substrate surrounded by the first spacer with the gate oxide film intervening therebetween; forming an elevated film on the substrate and the gate; forming the source/drain on the substrate; forming a second spacer at the side walls of the elevated film; and forming the metal silicide layer having been reacted with the elevated film.
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申请公布号 |
KR20000050568(A) |
申请公布日期 |
2000.08.05 |
申请号 |
KR19990000537 |
申请日期 |
1999.01.12 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
GU, JA HEUM;KIM, CHEOL SEONG;CHOI, CHEOL JUN;KIM, HYEONG SEOP |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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