发明名称 PLANT ABNORMALITY MONITORING DEVICE AND METHOD FOR IDENTIFYING ABNORMALITY OCCURRENCE PLACE
摘要 <p>PROBLEM TO BE SOLVED: To easily identify an abnormality occurrence place even about an abnormal event changing gradually on a long term basis by collating the qualitative change of each process state value of a plant with a knowledge database about its propagation relation. SOLUTION: The plane abnormality monitoring device is provided with a plant state measuring instrument 11 which measures the process value of each device in a plant, a data collecting device 12 which converts a process state signal into a numerical signal and stores it as plant state data in time series, an abnormality diagnostic device 13 which fixes an abnormality occurrence place based on the database where knowledge about the qualitative change of each process state value on a long term basis and a display device 14 which makes obtained diagnosis results illustrations and tables and shows them.</p>
申请公布号 JP2000214924(A) 申请公布日期 2000.08.04
申请号 JP19990018081 申请日期 1999.01.27
申请人 TOSHIBA CORP 发明人 HIROSE YUKINORI;SONODA YUKIO;UHARA YOSHIHIKO;YAMAMOTO HIROKI
分类号 G21C17/00;G05B23/02;(IPC1-7):G05B23/02 主分类号 G21C17/00
代理机构 代理人
主权项
地址