| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device, its testing method and design method with which it can be decided whether or not the semiconductor device is defective or a test mode controller is defective, when the test result of the semiconductor device fails and by which testing time can be shortened and the yield be improved. SOLUTION: This testing method includes a mode controller and a selection means for outputting a result that a test mode is judged during resetting, and it also includes a process for deciding the result of the executed test in a desired mode, when a result that a mode is decided to be transited to the desired mode is acceptable, a process for deciding the test result that a mode is transited to the test mode when the test is a failure, and a process for deciding it acceptable when the decision is acceptable even if the test is a failure.
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