| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device capable of accurately detecting temperature using conventional semiconductor manufacturing device and semiconductor manufacturing method. SOLUTION: Currents having different constant magnifications are outputted by transistors Tr1 and Tr2 having different sizes formed in the same semiconductor chip. The different currents are inputted to diodes D1, D2 having the same shape formed in the same semiconductor chip. Temperature is detected from differenceΔV of a voltage utilizing a phenomenon that temperature coefficients of voltages V1, V2 generated between diodes at this time are different by an input current. |
