发明名称 SCANNING INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To shorten the time required for a conduction inspection by electrically scanning a printed circuit board and excluding an inspection point that has been electrically appropriately connected from further conduction inspection. SOLUTION: A current is sent to a conductive layer to short-circuit the circuit of a printed circuit board. A row of wire brushes 26 pass through one or both of an upper conductive layer 12 and a lower conductive layer 14 and are extended. Each of the wire brushes 26 is wired to separate switches on the printed circuit board that is connected to an electronic device 30 for measurement. During inspection, a unit 16 passes the upper conductive layer 12 and the lower conductive layer 14, the switch of a wiper brush 26 is turned on when the wiper brush 26 passes above an inspection point, and the wiper brush 26 sends an inspection signal to the electronic device 30 for measurement. The electronic device 30 for measurement is provided with software having inspection data being classified for the specific unit 16 being inspected. The classified inspection data are compared with data from the wiper brush 26 and no further inspection is made when they comply with them.
申请公布号 JP2000214207(A) 申请公布日期 2000.08.04
申请号 JP19990297821 申请日期 1999.10.20
申请人 DELAWARE CAPITAL FORMATION INC 发明人 SWART MARK A
分类号 G01R31/02;G01R31/28;(IPC1-7):G01R31/02 主分类号 G01R31/02
代理机构 代理人
主权项
地址