SEMICONDUCTOR MEMORY DEVICE AND SEMICONDUCTOR TESTING METHOD

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor memory device which assures a shorter testing time. SOLUTION: A test pattern generation circuit 1 to generate a test pattern for disturbance test is provided within on SDRAM. A test pattern generated with the test pattern generation circuit 1 is given to the related circuit of the selected bank and the test pattern given from a tester is given to the related circuit of the other banks. Thereby, two or more kinds of tests may be done simultaneously.