发明名称 Methods for manufacturing photolithography masks utilizing interfering beams of radiation
摘要 A method for manufacturing a photolithography mask. At least two interfering beams of radiation are utilized to define a grid of dividing lines corresponding to an interference pattern produced by the interfering beams on a surface of a photolithography mask coated with a mask film.
申请公布号 US6096458(A) 申请公布日期 2000.08.01
申请号 US19980129297 申请日期 1998.08.05
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 HIBBS, MICHAEL STRAIGHT
分类号 G03F1/14;G03F7/20;(IPC1-7):G03F9/00 主分类号 G03F1/14
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