发明名称 PLASMA ETCHING APPARATUS FOR SEMICONDUCTOR WAFER
摘要 PURPOSE: A semiconductor wafer plasma etching apparatus is provided to effectively etch the semiconductor wafer by making plasma formed in the chamber concentrate on the semiconductor wafer to a probe installed on the wafer stage to have negative power applied. CONSTITUTION: In the plasma etching apparatus, a closed chamber(11) of a certain size is formed. Under the chamber, a semiconductor wafer to be etched is fixed as well as a wafer stage(12), an electrode where BIAS power is applied. On the chamber(11), there are a gas spray plate(14) and a coil(15) where SOURCE power is applied. On the wafer stage(12) in the chamber(11), a probe(16) where negative power is applied is formed to thereby concentrate the plasma on the semiconductor wafer fixed to the wafer stage(12).
申请公布号 KR100258867(B1) 申请公布日期 2000.08.01
申请号 KR19970069333 申请日期 1997.12.16
申请人 HYUNDAI MICRO ELECTRONICS CO.,LTD. 发明人 SONG, BYUNG SUNG
分类号 H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/3065
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