发明名称 APPARATUS AND METHOD FOR MEASURING THE THICKNESS OF SOLID MATERIAL AND THE ULTRASONIC VELOCITY
摘要 PURPOSE: A device and a method for simultaneously measuring thickness and ultrasonic wave speed of solid material are provided to measure ultrasonic wave speed, thickness of material and elastic coefficient of a thing measured by applying ultrasonic wave to the thing measured without manufacturing a contrast test sample. CONSTITUTION: A device for simultaneously measuring thickness and ultrasonic wave speed of solid material includes an ultrasonic wave generator generating ultrasonic wave and transferring it to a thing measured(1), an ultrasonic wave receiving part for receiving ultrasonic wave reflected from the thing to be measured, a calculating part determining added clock number by starting count at a standard time when ultrasonic wave is generated and stopping count at the time when ultrasonic wave is received, an operation control unit(9) determining ultrasonic wave progressing time, calculating a distance between an ultrasonic wave transferring point and ultrasonic wave receiving points, and an output unit(10) for outputting calculated information of the operation control unit to the outside.
申请公布号 KR100258747(B1) 申请公布日期 2000.08.01
申请号 KR19970066809 申请日期 1997.12.08
申请人 KOREA INSPECTION & ENGINEERING CO.,LTD. 发明人 LEE, JUNG GI];YOON, IN SIK;KIM, YOUNG HWAN
分类号 G01B17/02;(IPC1-7):G01B17/02 主分类号 G01B17/02
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