发明名称 |
APPARATUS AND METHOD FOR MEASURING THE THICKNESS OF SOLID MATERIAL AND THE ULTRASONIC VELOCITY |
摘要 |
PURPOSE: A device and a method for simultaneously measuring thickness and ultrasonic wave speed of solid material are provided to measure ultrasonic wave speed, thickness of material and elastic coefficient of a thing measured by applying ultrasonic wave to the thing measured without manufacturing a contrast test sample. CONSTITUTION: A device for simultaneously measuring thickness and ultrasonic wave speed of solid material includes an ultrasonic wave generator generating ultrasonic wave and transferring it to a thing measured(1), an ultrasonic wave receiving part for receiving ultrasonic wave reflected from the thing to be measured, a calculating part determining added clock number by starting count at a standard time when ultrasonic wave is generated and stopping count at the time when ultrasonic wave is received, an operation control unit(9) determining ultrasonic wave progressing time, calculating a distance between an ultrasonic wave transferring point and ultrasonic wave receiving points, and an output unit(10) for outputting calculated information of the operation control unit to the outside.
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申请公布号 |
KR100258747(B1) |
申请公布日期 |
2000.08.01 |
申请号 |
KR19970066809 |
申请日期 |
1997.12.08 |
申请人 |
KOREA INSPECTION & ENGINEERING CO.,LTD. |
发明人 |
LEE, JUNG GI];YOON, IN SIK;KIM, YOUNG HWAN |
分类号 |
G01B17/02;(IPC1-7):G01B17/02 |
主分类号 |
G01B17/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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