发明名称 Test permutator
摘要 Disclosed is the selecting of permutations of a plurality of parameters, each parameter comprising a plurality of parameter values, for applying the selected permutations as a permutation sequence to a device under test DUT. At first, a cycle size representing the number of parameter values in a parameter cycle to be repeated successively in the permutation sequence is defined for each parameter. The following criteria have to be met: a) the cycle sizes have to be different for all parameter cycles, b) each cycle size has to be equal or greater than the number of different parameter values of the respective parameter, and c) two cycle sizes must not have one or more factors in common. Each parameter cycle is provided with parameter values from that parameter according to the defined cycle size, and the parameter cycles can be repeated concurrently, preferably until a given termination criterion is reached all possible permutations have been selected.
申请公布号 US6098186(A) 申请公布日期 2000.08.01
申请号 US19980087780 申请日期 1998.05.29
申请人 HEWLETT-PACKARD COMPANY 发明人 RIVOIR, JOCHEN
分类号 G01R31/3183;(IPC1-7):G01R31/28 主分类号 G01R31/3183
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