发明名称 Substrate processing apparatus and substrate processing method
摘要 An apparatus includes a mounting table which is a main temperature controlling plate (a main cooling plate), a cooling section for maintaining the mounting table, for example, at 23 DEG C., a holding pin for holding a wafer while lifting it slightly off the mounting table, a mechanism for raising and lowering the pin, an auxiliary cooling plate as an auxiliary temperature controlling plate for cooling the wafer from the opposite side to the mounting table, and raising and lowering means for raising and lowering the auxiliary cooling plate to thereby move it close to and away from the wafer. The auxiliary cooling plate is maintained at a lower temperature than the main cooling plate. The wafer starts to be cooled by the main cooling plate and the auxiliary cooling plate, the auxiliary cooling plate is then moved away from the wafer at a temperature slightly higher than 23 DEG C., for example, at 30 DEG C., and thereafter the wafer is cooled only by the main cooling plate. Thus, the cooling of the wafer can be performed with high efficiency.
申请公布号 US6097005(A) 申请公布日期 2000.08.01
申请号 US19990376984 申请日期 1999.08.19
申请人 TOKYO ELECTRON LIMITED 发明人 AKIMOTO, MASAMI
分类号 H01L21/027;H01L21/00;H01L21/687;(IPC1-7):H05B3/68;C23C16/00 主分类号 H01L21/027
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