发明名称 |
OPEN DRAIN INPUT/OUTPUT STRUCTURE OF SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THEREOF |
摘要 |
PURPOSE: A structure of an open drain input/output terminal of a semiconductor device and a fabrication method thereof are provided, which can be applied to a MASKROM embedded MCU and an EPROM embedded MCU without additional process after forming a gate, by forming a gate line width of an enhancement transistor connected to an input/output pad larger than an impurity implanted region formed on a channel region. CONSTITUTION: In an enhancement transistor, a gate insulation film(34) is formed on an active region(F) on a P-type semiconductor substrate(30) comprising a field oxide(32), and a gate(36) of W-silicide(36b)/polysilicon(36a) stacked structure is formed on a part of the gate insulation film. A spacer(38) of insulation film is formed on both side walls of the gate. And, an N-type source/drain region(42a,42b) comprising an LDD(Lightly Doped Drain)(40) is formed in the substrate on the right and left side of the gate. And, an N-type impurity implanted region(44) is formed on a channel region below the gate so that the region is connected with the source region in a body and is separated from the drain region.
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申请公布号 |
KR100262457(B1) |
申请公布日期 |
2000.08.01 |
申请号 |
KR19980015975 |
申请日期 |
1998.05.04 |
申请人 |
SAMSUNG ELEC0TRONICS CO, LTD. |
发明人 |
SHIM, BYUNG-SUP;KIM, YOUNG-HO |
分类号 |
H01L27/102;H01L21/8234;H01L27/088;H01L29/10;H01L29/78;(IPC1-7):H01L27/102 |
主分类号 |
H01L27/102 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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