发明名称 MANUFACTURING METHOD OF TRIPLE WELL OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming the triple well of a semiconductor device is provided to improve the control of the threshold voltage and the characteristic of punch-through in the device by forming the triple well having the desired doping density and operating independently. CONSTITUTION: A buried n-well(15) is formed on a p-type semiconductor device on which a field oxide film is formed. The buried n-well(15) is narrower than a n-well to be defined on the substrate, and wider than a p-well-2 to be defined on the substrate. Further, the buried n-well(15) connects with the n-well, and separates a p-well and the p-well-2. The n-well is formed on the whole structure by using an n-well mask. The p-well is formed on the whole structure by using a p-well mask. The p-well-2 is formed on the whole structure by using a p-well-2 mask.
申请公布号 KR100261963(B1) 申请公布日期 2000.08.01
申请号 KR19970077378 申请日期 1997.12.29
申请人 HYUNDAI ELECTRONICS IND. CO.,LTD 发明人 KIM, YONG-TAIK;LEE, BYEONG-RYEOL
分类号 H01L21/22;(IPC1-7):H01L21/22 主分类号 H01L21/22
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