发明名称 |
MANUFACTURING METHOD OF TRIPLE WELL OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming the triple well of a semiconductor device is provided to improve the control of the threshold voltage and the characteristic of punch-through in the device by forming the triple well having the desired doping density and operating independently. CONSTITUTION: A buried n-well(15) is formed on a p-type semiconductor device on which a field oxide film is formed. The buried n-well(15) is narrower than a n-well to be defined on the substrate, and wider than a p-well-2 to be defined on the substrate. Further, the buried n-well(15) connects with the n-well, and separates a p-well and the p-well-2. The n-well is formed on the whole structure by using an n-well mask. The p-well is formed on the whole structure by using a p-well mask. The p-well-2 is formed on the whole structure by using a p-well-2 mask.
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申请公布号 |
KR100261963(B1) |
申请公布日期 |
2000.08.01 |
申请号 |
KR19970077378 |
申请日期 |
1997.12.29 |
申请人 |
HYUNDAI ELECTRONICS IND. CO.,LTD |
发明人 |
KIM, YONG-TAIK;LEE, BYEONG-RYEOL |
分类号 |
H01L21/22;(IPC1-7):H01L21/22 |
主分类号 |
H01L21/22 |
代理机构 |
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主权项 |
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地址 |
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