发明名称 Gapfill of semiconductor structure using doped silicate glasses
摘要 Improved gap fill of narrow spaces is achieved by using a doped silicate glass having a dopant concentration in a bottom portion thereof which is greater than an amount which causes surface crystal growth and in an upper portion thereof having a lower dopant concentration such that the overall dopant concentration of the doped silicate glass is below that which causes surface crystal growth.
申请公布号 US6096654(A) 申请公布日期 2000.08.01
申请号 US19970942273 申请日期 1997.09.30
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 KIRCHHOFF, MARKUS M.;ILG, MATTHIAS
分类号 H01L21/316;H01L21/762;H01L21/768;H01L23/522;(IPC1-7):H01L21/302 主分类号 H01L21/316
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