发明名称 |
FABRICATION OF SEMICONDUCTOR STRUCTURE HAVING SELF- ALIGNED SPACER |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for forming an improved self-aligned spacer. SOLUTION: A conductive gate structure is provided on a semiconductor substrate 1 and a first dielectric gate cap material layer and a second dielectric material layer 5 are provided thereon. Subsequently, a region 6 of high dopant level is provided on the second dielectric material layer 5 for fabricating a self-aligned spacer. Selective etching takes place through the dopant and a self-aligned conductive spacer is defined. |
申请公布号 |
JP2000208499(A) |
申请公布日期 |
2000.07.28 |
申请号 |
JP19990372515 |
申请日期 |
1999.12.28 |
申请人 |
INTERNATL BUSINESS MACH CORP <IBM> |
发明人 |
MICHAEL AAMAKOSUTO;SANDRA G MARUHOTORA;TINA WAGNER;RICHARD WISE |
分类号 |
H01L21/302;H01L21/3065;H01L21/311;H01L21/336;H01L21/60;H01L29/78;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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