发明名称 FABRICATION OF SEMICONDUCTOR STRUCTURE HAVING SELF- ALIGNED SPACER
摘要 PROBLEM TO BE SOLVED: To provide a method for forming an improved self-aligned spacer. SOLUTION: A conductive gate structure is provided on a semiconductor substrate 1 and a first dielectric gate cap material layer and a second dielectric material layer 5 are provided thereon. Subsequently, a region 6 of high dopant level is provided on the second dielectric material layer 5 for fabricating a self-aligned spacer. Selective etching takes place through the dopant and a self-aligned conductive spacer is defined.
申请公布号 JP2000208499(A) 申请公布日期 2000.07.28
申请号 JP19990372515 申请日期 1999.12.28
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 MICHAEL AAMAKOSUTO;SANDRA G MARUHOTORA;TINA WAGNER;RICHARD WISE
分类号 H01L21/302;H01L21/3065;H01L21/311;H01L21/336;H01L21/60;H01L29/78;(IPC1-7):H01L21/306 主分类号 H01L21/302
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