发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT AND TEST METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To manage scribed tested results of respective chips corresponding to the position of a wafer, even without loading memory which is not required for original functions. SOLUTION: On a one-chip microcomputer 1 applied to a semiconductor integrated circuit loads a CPU 11, ROM 12, electric erasable programmable read only memory(EEPROM) 13, RAM 14 and peripheral function 15. The EEPROM 13 is an electrically data writable and erasable nonvolatile memory, and on the test stage of the one-chip microcomputer 1, the tested result is written. When the testing of the one-chip microcomputer 1 is completed, the tested result which was written in the EEPROM 13 is erased, and a control program to be executed by the CPU 11 is written there. After product assembly, the CPU 11 performs processings, such as operation control of a mechanical device by a control program written in the EEPROM 13.
申请公布号 JP2000208567(A) 申请公布日期 2000.07.28
申请号 JP19990008862 申请日期 1999.01.18
申请人 NEC CORP 发明人 ITO JUN
分类号 G06F11/22;G01R31/28;H01L21/66 主分类号 G06F11/22
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