发明名称 SEMICONDUCTOR DEVICE AND PRODUCTION THEREOF
摘要 <p>PROBLEM TO BE SOLVED: To make needles, etc., of a probe card hard to slip, and to reduce the contact resistance in comparison to the conventional cases. SOLUTION: This semiconductor device is provided with an electrode pad (first and second metal wiring layers) provided on a semiconductor substrate (silicone substrate 1) and forming the central part thereof to be lower than the peripheral edge thereof, a diffusion layer 9 provided below the electrode pad, a field oxide film 10 provided around the electrode pad, and an interlayer insulating film 2 provided around the electrode pad and having a thickness larger than the peripheral edge of the electrode pad.</p>
申请公布号 JP2000208554(A) 申请公布日期 2000.07.28
申请号 JP19990009557 申请日期 1999.01.18
申请人 NEC CORP 发明人 UEDA TORU
分类号 H01L21/60;(IPC1-7):H01L21/60 主分类号 H01L21/60
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