发明名称 |
COLLECTIVE ETCHING OF MULTILAYER DIFFERENT KIND INSULATING FILM |
摘要 |
PROBLEM TO BE SOLVED: To carry out etching a multiplayer sample of an organic SOG based insulating film having low permittivity and SiO2 collectively at high rate with good profile. SOLUTION: The ratio of oxygen gas flow rate to etching gas flow rate is set in the range of 0.7-1.3 using a semi-gap parallel plate type UHF band ECR plasma etching system. A gas containing at least any one kind of elements of carbon, fluorine and hydrogen is employed as an etching gas and a gas which can supplying oxygen through dissociation in plasma is employed as an alternative gas of oxygen gas.
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申请公布号 |
JP2000208481(A) |
申请公布日期 |
2000.07.28 |
申请号 |
JP19990002580 |
申请日期 |
1999.01.08 |
申请人 |
HITACHI LTD;HITACHI TECHNO ENG CO LTD |
发明人 |
YAMAMOTO SEIJI;YOSHIDA TAKESHI |
分类号 |
H01L21/302;H01L21/3065;H01L21/768;H01L23/522;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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