发明名称 COLLECTIVE ETCHING OF MULTILAYER DIFFERENT KIND INSULATING FILM
摘要 PROBLEM TO BE SOLVED: To carry out etching a multiplayer sample of an organic SOG based insulating film having low permittivity and SiO2 collectively at high rate with good profile. SOLUTION: The ratio of oxygen gas flow rate to etching gas flow rate is set in the range of 0.7-1.3 using a semi-gap parallel plate type UHF band ECR plasma etching system. A gas containing at least any one kind of elements of carbon, fluorine and hydrogen is employed as an etching gas and a gas which can supplying oxygen through dissociation in plasma is employed as an alternative gas of oxygen gas.
申请公布号 JP2000208481(A) 申请公布日期 2000.07.28
申请号 JP19990002580 申请日期 1999.01.08
申请人 HITACHI LTD;HITACHI TECHNO ENG CO LTD 发明人 YAMAMOTO SEIJI;YOSHIDA TAKESHI
分类号 H01L21/302;H01L21/3065;H01L21/768;H01L23/522;(IPC1-7):H01L21/306 主分类号 H01L21/302
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