发明名称 METHOD FOR DIAGNOSING MEMORY DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To obtain a method for diagnosing the fault of a memory element by referring to a memory address where single-bit error occurrence is recorded and deciding that a control circuit in a memory element has gone out of order, when the memory addresses for single-bit errors generated in a prescribed time are more than a prescribed number. SOLUTION: When the type of the latest error in an error log file is '01', a memory error file is referred to (30). The memory address of the last error log in the memory error file is compared with the memory address of the latest error (40), and when the addresses do not match each other, the current number of memory addresses is compared with a previously set prescribed value (60). When prescribed value is exceeded, it is decided that the control circuit of the memory element is out of order (70) on condition that the generation time difference between the oldest error log and the latest error log in the memory error file is within the previously set prescribed time, thereby outputting an alarm (80). Then all the error logs in the memory error file are erased (90).</p>
申请公布号 JP2000207291(A) 申请公布日期 2000.07.28
申请号 JP19990006091 申请日期 1999.01.13
申请人 HITACHI LTD 发明人 HIUGA KAZUHIRO;FUKUMARU HIROAKI
分类号 G06F12/16;G06F11/34;G11C16/06;(IPC1-7):G06F12/16 主分类号 G06F12/16
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