发明名称 AQUEOUS DISPERSOID FOR CHEMICAL-MECHANICAL POLISHING IN MANUFACTURING SEMICONDUCTOR DEVICE AND MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an aqueous dispersoid for chemical-mechanical polishing in manufacturing a semiconductor device which has an adequate hardness, provides a satisfactory polishing rate and avoids damaging a polished surface and a method of polishing films of a semiconductor device with this aqueous dispersoid and manufacturing the semiconductor device. SOLUTION: An aqueous dispersoid for chemical-mechanical polishing in manufacturing a semiconductor device is obtained which contains at least one kind of polymer grains selected among polymer grains obtained by copolymerizing a cross linking monomer such as divinylbenzene with other monomers such as styrene and polymer grains of a specified mean grain size obtained by copolymerizing these specific monomers. A semiconductor device is obtained by a manufacturing method having a step of polishing films with the aqueous dispersoid used as abrasives.
申请公布号 JP2000208452(A) 申请公布日期 2000.07.28
申请号 JP19990009901 申请日期 1999.01.18
申请人 TOSHIBA CORP;JSR CORP 发明人 YANO HIROYUKI;HAYASAKA NOBUO;OKUMURA KATSUYA;IIO AKIRA;HATTORI MASAYUKI;MOTONARI MASAYUKI
分类号 H01L21/304;C08L101/00;C09K3/14;(IPC1-7):H01L21/304 主分类号 H01L21/304
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