发明名称 |
AQUEOUS DISPERSOID FOR CHEMICAL-MECHANICAL POLISHING IN MANUFACTURING SEMICONDUCTOR DEVICE AND MANUFACTURE OF SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide an aqueous dispersoid for chemical-mechanical polishing in manufacturing a semiconductor device which has an adequate hardness, provides a satisfactory polishing rate and avoids damaging a polished surface and a method of polishing films of a semiconductor device with this aqueous dispersoid and manufacturing the semiconductor device. SOLUTION: An aqueous dispersoid for chemical-mechanical polishing in manufacturing a semiconductor device is obtained which contains at least one kind of polymer grains selected among polymer grains obtained by copolymerizing a cross linking monomer such as divinylbenzene with other monomers such as styrene and polymer grains of a specified mean grain size obtained by copolymerizing these specific monomers. A semiconductor device is obtained by a manufacturing method having a step of polishing films with the aqueous dispersoid used as abrasives.
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申请公布号 |
JP2000208452(A) |
申请公布日期 |
2000.07.28 |
申请号 |
JP19990009901 |
申请日期 |
1999.01.18 |
申请人 |
TOSHIBA CORP;JSR CORP |
发明人 |
YANO HIROYUKI;HAYASAKA NOBUO;OKUMURA KATSUYA;IIO AKIRA;HATTORI MASAYUKI;MOTONARI MASAYUKI |
分类号 |
H01L21/304;C08L101/00;C09K3/14;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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