发明名称 METHOD FOR MACHINING SILICON SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a machining method of silicon substrate in which trenches having significantly different depth can be made easily in a silicon substrate. SOLUTION: A machining method of silicon substrate comprises a step 101 for depositing an oxide film of specified thickness corresponding to a shallow trench in a silicon substrate, a step 102 for forming a mask pattern on the oxide film, a step 103 for etching the silicon substrate to form the etching mask pattern of oxide film, and a step 104 for depositing an oxide film having thickness T determined according to a specified operational expression on the oxide film mask pattern. The machining method further comprises a step 105 for forming an oxide film etching mask pattern corresponding to a deep trench in the upper surface of the oxide film, a step 106 for forming the mask pattern on the upper surface of the silicon substrate 1, and a step 107 for making two trenches of desired profile and depth in the silicon substrate 1 by etching.
申请公布号 JP2000208484(A) 申请公布日期 2000.07.28
申请号 JP19990004191 申请日期 1999.01.11
申请人 JAPAN AVIATION ELECTRONICS INDUSTRY LTD 发明人 MASE TAKAO
分类号 H01L21/302;H01L21/306;H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/302
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