发明名称 METHOD FOR MEASURING STEP ON TRANSPARENT FILM AND METHOD FOR FORMING PHASE SHIFT MASK
摘要 <p>PROBLEM TO BE SOLVED: To measure a step on a phase shifter fast nondestructively with high precision through easy operation without contacting when measuring a step on a transparent film. SOLUTION: In a process included in the measuring method, correlation between step quantities t1,..., tn of 1st grooves S1,..., Sn formed in part of a 1st transparent film 2 and the values of parameters indicating the polarization state of reflected lights from the 1st grooves S1,..., Sn is found and held in the form of a data base. Then 1st value of a parameter representing the polarized state of a reflected light of a 2nd groove 45 formed in part of a 2nd transparent film 424 is measured and a 1st step quantity of the 2nd groove 45 is found on the basis of the 1sts value and the correlation in the data base.</p>
申请公布号 JP2000205828(A) 申请公布日期 2000.07.28
申请号 JP19990010082 申请日期 1999.01.19
申请人 FUJITSU LTD 发明人 HOSHI KENJI;KAWAMURA EIICHI
分类号 H01L21/027;G01B7/34;G01B11/02;G01Q60/24;G03F1/26;G03F1/68;(IPC1-7):G01B11/02;G03F1/08 主分类号 H01L21/027
代理机构 代理人
主权项
地址