发明名称 RESIN-SEALED SEMICONDUCTOR DEVICE AND PRODUCTION THEREOF
摘要 <p>PROBLEM TO BE SOLVED: To reduce electric degradation caused by cracking of a bonding part. SOLUTION: This resin-sealed semiconductor device has rewiring 3 of Cu connected to an electrode pad 2 of a semiconductor device 1, the surface of Cu post 4 connected to this rewiring 3 and an anisotropic conductive resin 5 sealed are flush with each other as the Cu post 4, the device is approximates the size into semiconductor device fractionized by processing in a wafer state of arranged plural semiconductor devices 1, and the anisotropic conductive resin 5 is sealed up to side surface of the semiconductor device 1.</p>
申请公布号 JP2000208559(A) 申请公布日期 2000.07.28
申请号 JP19990004935 申请日期 1999.01.12
申请人 OKI ELECTRIC IND CO LTD 发明人 OOUCHI NOBUHITO
分类号 H01L23/12;H01L21/301;H01L21/56;H01L21/60;H01L23/29;H01L23/31;(IPC1-7):H01L21/60 主分类号 H01L23/12
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