发明名称 REPAIR CIRCUIT FOR SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To make repairable at the stages of water and package by providing plural anti-fuses short-circuiting by a programming signal from the out side, an anti-fuse program section generating a signal relating to a state of the anti- fuse, and a second fuse section switching in accordance with an output signal of the anti-fuse program section. SOLUTION: A column repair control section 30 outputs a control signal for performing column repair. An anti-fuse program section 40 comprises plural, for example, 22 anti-fuses, and generates a signal R<1:22> relating to the state of anti-fuses. The anti-fuses are programmed in accordance with a programming signal supplied from the outside, that is, high voltage HV and a decoding signal SDA. A repair signal generating section 50 receives other input signal and the signal R<1:22> from the anti-fuse program section 40, and generates a repair signal spb.
申请公布号 JP2000207896(A) 申请公布日期 2000.07.28
申请号 JP20000003047 申请日期 2000.01.11
申请人 HYUNDAI ELECTRONICS IND CO LTD 发明人 O JINGUN;KIM PIRUJUN;UI JEGYON;YU DOKUHYON;SORU YONHO;CHOO HOYOPU
分类号 G11C11/401;G11C11/407;G11C29/00;G11C29/04;H01L21/8242;H01L27/108 主分类号 G11C11/401
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