| 摘要 |
PROBLEM TO BE SOLVED: To obtain a module IC of a module IC handler which performs test while transferring a carrier on which a plurality of module IC's are loaded between processes, and a handling method of the carrier. SOLUTION: In this module IC handling method of a module IC handler, a plurality of module IC's are perpendicularly accommodated in a carrier 18. Test of the module IC's is performed in a test site while the module IC's are accommodated in the carrier, while transferring the carrier 18 in which the module IC's are accommodated between test processes. After that, the module IC's wherein test at an unloading position 20 is completed are held with a pickup means of an unloading side and classified in a customer tray.
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