| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory which can perform efficiently a burn-in test with a simple constitution, and its test method. SOLUTION: This semiconductor memory 100 is constituted of a storage means 80 which comprises word lines 50 and bit lines 60 and consists of a memory cell array consisting of memory cells 70 provided respectively at each intersecting point of word lines 50 and bit lines 60, a word line selecting means 3 selecting a word line 50 of the storage means 80, a first internal power source boosting means 2 raising independently word lines 50 to a prescribed voltage, a first external voltage terminal 20 connected to the first internal power source boosting means 2, and a test performing means 4 performing a prescribed test for the storage means 80 responding to a control signal 401 from the outside. The device is further provided with a second internal power source boosting means 6 generating higher voltage than voltage outputted by the first internal power source boosting means 2 and supplying it to word lines 50, and a second external voltage terminal 21 to which different voltage from voltage applied to the fist external voltage terminal 20 is applied. |
