发明名称 |
PIN HOLE DETECTOR FOR MEASURING INTENSITY DISTRIBUTION OF ELECTRON BEAM |
摘要 |
PROBLEM TO BE SOLVED: To provide a pin hole detector capable of measuring the intensity distribution of electrons with sufficient accuracy by preventing the pin hole from causing rear scattering of the electrons. SOLUTION: An illumination intensity distribution, measuring device for an electron beam projection exposure device is provided with: a leticle BR provided with a sub-field; a pin hole plate that is arranged on the image surface of the electron beam projection exposure device and formed of a block of a material having a high-aspect-ratio pin hole PH and a small atomic number; a means SC for detecting electrons that pass the pin hole; and a means for moving and scanning the pin hole in relation to a fixed electron intensity distribution, or a means DY for scanning the electron intensity distribution in relation to the pin hole when retained at a fixed position.
|
申请公布号 |
JP2000208079(A) |
申请公布日期 |
2000.07.28 |
申请号 |
JP19990244020 |
申请日期 |
1999.08.30 |
申请人 |
NIKON CORP |
发明人 |
GOLLADAY STEVEN D;RODNEY ARTHUR KENDALL;MITCHELL STEWART GORDON;BOHNENKAMP CARL E |
分类号 |
H01J37/04;G01T1/29;H01J37/244;H01J37/305;H01J37/317;H01L21/027;(IPC1-7):H01J37/04 |
主分类号 |
H01J37/04 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|