发明名称 PIN HOLE DETECTOR FOR MEASURING INTENSITY DISTRIBUTION OF ELECTRON BEAM
摘要 PROBLEM TO BE SOLVED: To provide a pin hole detector capable of measuring the intensity distribution of electrons with sufficient accuracy by preventing the pin hole from causing rear scattering of the electrons. SOLUTION: An illumination intensity distribution, measuring device for an electron beam projection exposure device is provided with: a leticle BR provided with a sub-field; a pin hole plate that is arranged on the image surface of the electron beam projection exposure device and formed of a block of a material having a high-aspect-ratio pin hole PH and a small atomic number; a means SC for detecting electrons that pass the pin hole; and a means for moving and scanning the pin hole in relation to a fixed electron intensity distribution, or a means DY for scanning the electron intensity distribution in relation to the pin hole when retained at a fixed position.
申请公布号 JP2000208079(A) 申请公布日期 2000.07.28
申请号 JP19990244020 申请日期 1999.08.30
申请人 NIKON CORP 发明人 GOLLADAY STEVEN D;RODNEY ARTHUR KENDALL;MITCHELL STEWART GORDON;BOHNENKAMP CARL E
分类号 H01J37/04;G01T1/29;H01J37/244;H01J37/305;H01J37/317;H01L21/027;(IPC1-7):H01J37/04 主分类号 H01J37/04
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