| 摘要 |
PROBLEM TO BE SOLVED: To enable an inspection device to carry out accurate inspection by making a specific current flow between the measuring terminals of an inspecting device and the lead wire of an electronic component, reducing the contact resistance between the measuring terminals and the lead wire, and impressing voltage for characteristic inspection. SOLUTION: The measuring terminals S1-S2 of the characteristic inspecting test device are brought into contact with the lead wire 1a of a reed-type electronic component DUT such as a diode, and the measuring terminals S3-S4 of the inspecting test device are brought into contact with the lead wire 1b. For inspecting the contact state between the measuring terminals S1 and S2 and the lead wire 1a, the movable contacts of relays RY11-RY14 are brought into contact with a fixed contact (a) and are turned in mode 1. Then, when a switch SW1 is turned on, inspecting current 11 is passed in a path from a power source E1 to a resistance R1, the relay RY13, the measuring terminal S1, the lead wire 1a, the measuring terminal S2, the relay RY14, and the switch SW1. The inspecting current 11 is in a range of 10-30A for reducing the contact resistance.
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