发明名称 |
Method of forming a flash memory cell |
摘要 |
<p>A method of forming a flash memory cell including a storage transistor and an access transistor comprises providing a tunnel oxide layer (801) on a substrate; depositing and patterning a floating gate (803) on said first oxide layer; providing a dielectric layer (804) over said floating gate; removing said dielectric layer except for the portion of said dielectric layer located over said floating gate; forming a gate oxide layer over a portion of said substrate exposed by the previous step (d); and depositing and patterning a conductive layer to form a control gate (805) for said storage transistor over the dielectric layer (804), and a gate (805A) for said access transistor over the gate oxide layer.</p> |
申请公布号 |
EP1022780(A2) |
申请公布日期 |
2000.07.26 |
申请号 |
EP20000108246 |
申请日期 |
1997.06.13 |
申请人 |
SEIKO EPSON CORPORATION |
发明人 |
DEJENFELT, ANDERS T.;RAO, KAMESWARA K.;SIMMONS, GEORGE H.;FURUHATA, TOMOYUKI |
分类号 |
H01L21/8247;G11C16/04;G11C16/10;G11C16/16;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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