发明名称 |
SEMICONDUCTOR DEVICE, IMAGE DISPLAY DEVICE, AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE AND IMAGE DISPLAY DEVICE |
摘要 |
PURPOSE: A method for fabricating a semiconductor device having a CMOS-TFT is provided which can establish a threshold voltage of the CMOS-TFT easily and very accurately. CONSTITUTION: According to a method for fabricating a semiconductor device having a CMOS-TFT, a selective addition and a non-selective addition of a P-type impurity(Boron) are performed continuously to control a threshold voltage(Vthp,Vthn). The method includes the processes of: adding the P-type impurity into the whole structure including a P-type and an N-type transistor region of a thin film non-selectively; adding the P-type impurity into an N-type thin film transistor of the thin film selectively; and activating the added P-type impurity by annealing the thin film. The threshold voltages of the P-type and the N-type thin film transistor are established independently by the non-selective and selective addition. |
申请公布号 |
KR20000047399(A) |
申请公布日期 |
2000.07.25 |
申请号 |
KR19990016892 |
申请日期 |
1999.05.12 |
申请人 |
FUJITSU LIMITIED |
发明人 |
JANG, HONG YONG;IGARASIMAKOTO;YANAIGENIZI;HORIDESRO;DAKIZAWAYUTAKA |
分类号 |
H01L27/092;G02F1/136;G02F1/1368;H01L21/336;H01L21/77;H01L21/8238;H01L21/84;H01L27/08;H01L27/12;H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
H01L27/092 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|