发明名称 |
CIRCUIT FOR DETECTING TRANSITION OF ADDRESS FOR SEMICONDUCTOR MEMORY DEVICE |
摘要 |
PURPOSE: A semiconductor memory device is provided to prevent a read fail by cutting an output of latch signal from a detecting amplifier though control signals of detecting amplifier. CONSTITUTION: A detecting circuit of address transition contains a summator(210) to generate a first pulse signal by summing signals detected a change of an outer address signal. A first noise filter(220) outputs a second pulse signal having a pulse width as a previously set delayed time by receiving the first pulse signal. A first generating circuit of short pulse(230) generates a third pulse signal by delaying and reversing the second pulse signal. A second generating circuit of short pulse(240) outputs a reference signal to set latch activating section of the detecting amplifier by receiving the third pulse signal when the first pulse signal is inputted to the first noise filter. A second noise filter(270) outputs a latch signal of detecting amplifier by receiving the reference signal and reducing a pulse width of the reference signal.
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申请公布号 |
KR20000045690(A) |
申请公布日期 |
2000.07.25 |
申请号 |
KR19980062261 |
申请日期 |
1998.12.30 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KWAK, PAN SEOK |
分类号 |
G11C11/41;G11C7/06;G11C11/408;(IPC1-7):G11C11/408 |
主分类号 |
G11C11/41 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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