发明名称 CIRCUIT FOR DETECTING TRANSITION OF ADDRESS FOR SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE: A semiconductor memory device is provided to prevent a read fail by cutting an output of latch signal from a detecting amplifier though control signals of detecting amplifier. CONSTITUTION: A detecting circuit of address transition contains a summator(210) to generate a first pulse signal by summing signals detected a change of an outer address signal. A first noise filter(220) outputs a second pulse signal having a pulse width as a previously set delayed time by receiving the first pulse signal. A first generating circuit of short pulse(230) generates a third pulse signal by delaying and reversing the second pulse signal. A second generating circuit of short pulse(240) outputs a reference signal to set latch activating section of the detecting amplifier by receiving the third pulse signal when the first pulse signal is inputted to the first noise filter. A second noise filter(270) outputs a latch signal of detecting amplifier by receiving the reference signal and reducing a pulse width of the reference signal.
申请公布号 KR20000045690(A) 申请公布日期 2000.07.25
申请号 KR19980062261 申请日期 1998.12.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KWAK, PAN SEOK
分类号 G11C11/41;G11C7/06;G11C11/408;(IPC1-7):G11C11/408 主分类号 G11C11/41
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