发明名称 Holographic interferometry for monitoring and controlling laser shock peening
摘要 A method for quality assurance of a laser shock peening process uses interferometry to form a fringe image from first and second interferograms of unstressed and stressed laser shock peened patches respectively of a workpiece. The fringe image may then be compared to a predetermined correlation of fringe images for indicating quality assurance. Stressing the laser shock peened patch may include loading the production and test workpieces during the production of the first and second images by interferometry while the production and test workpieces are fixtured. The loading may be done by heating, twisting, or bending of at least a portion of the production and test workpieces. The comparing of the production images of fringes may include comparing fringe characteristics of the laser shock peened patches on the production workpieces laser against fringe characteristics of the predetermined correlation.
申请公布号 US6094260(A) 申请公布日期 2000.07.25
申请号 US19980133100 申请日期 1998.08.12
申请人 GENERAL ELECTRIC COMPANY 发明人 ROCKSTROH, TODD J.;SCHEIDT, WILBUR D.
分类号 B23K26/03;G01B9/021;(IPC1-7):G01B9/02 主分类号 B23K26/03
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