发明名称 POLISHING PAD AND METHOD FOR MAKING POLISHING PAD WITH ELONGATED MICROCOLUMNS
摘要 <p>PURPOSE: A polishing pad with elongated microcolumns is provided to uniform the planarity of the surface of the wafer. CONSTITUTION: A polishing pad(42) for use in chemical-mechanical planarization (CMP) of semiconductor wafers includes a multiplicity of elongated microcolumns(48) embedded in a matrix material body. The elongated microcolumns(48) are oriented parallel to each other and extend from a planarizing surface used to planarize the semiconductor wafers. The elongated microcolumns(48) are uniformly distributed throughout the polishing pad(42) in order to impart uniform properties throughout the polishing pad. The polishing pad can also include elongated pores(50) either coaxial width or interspersed between the elongated microcolumns(48) to provide uniform porosity throughout the polishing pad(42).</p>
申请公布号 KR20000048753(A) 申请公布日期 2000.07.25
申请号 KR19997002739 申请日期 1999.03.30
申请人 MICRONTECHNOLOGY, INC. 发明人 DOAN TRUNG TRI;MEIKLE SCOTT G
分类号 B24B37/26;B24D11/00;B24D13/14;H01L21/304;(IPC1-7):H01L21/304 主分类号 B24B37/26
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