发明名称 |
METHOD FOR PREVENTING BLACK SILICON FROM BEING FORMED ON WAFER EDGE AND APPARATUS FOR DOING THE SAME |
摘要 |
PURPOSE: A method for preventing a black silicon from being formed on a wafer edge and an apparatus for doing the same are provided to increase the chip yield by rejecting black silicon spike from the semiconductor substrate. CONSTITUTION: A method for preventing a black silicon from being formed on a wafer edge includes following steps. At the first step, a wafer(10) is provided for manufacturing the semiconductor chip. At the second step, a first layer(16) is deposited on the whole surface(14) of the silicon wafer. At the third step, the first layer is removed from the silicon wafer so as to expose a region fit for the semiconductor device. At the forth step, the wafer is etched so as to prevent the etched material from remaining on the wafer. The first layer according to one embodiment of the present invention is an oxide layer.
|
申请公布号 |
KR20000047991(A) |
申请公布日期 |
2000.07.25 |
申请号 |
KR19990055693 |
申请日期 |
1999.12.08 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION.;SIEMENS AKTIENGESELLSCHAFT |
发明人 |
PEREUNG, DUNG-CHING;DOBUCHINSEUKI, DEIBIDEU,EM.;WANG, TINGHAO;ROITEUNEO, KEULRAUSEU |
分类号 |
H01L21/302;H01L21/20;H01L21/306;H01L21/3065;H01L21/308;H01L21/316;(IPC1-7):H01L21/20 |
主分类号 |
H01L21/302 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|