发明名称 DEVICE FOR MEASUREMENT OF NODE DESIGNED FOR PROCESS INTERFACE AND ITS METHOD
摘要 PURPOSE: A device for measurement of node designed for process interface is disclosed to increase the accuracy of the node test and to minimize the test time by eliminating the need to move communication cable to examine the node that needs to be tested. CONSTITUTION: A device for measurement of node designed for process interface is composed of reception, transmission, storation, and connection. Tx/Rx buffer 1(220) receives test data from CPU(210) and transmits it to Tx/Rx buffer2(222). Tx/Rx buffer 2 receives and stores the test data and enables the loading of CPU. Buffer 2 receives and stores the test data from Tx/Rx buffer 1 through communication cable(250) and enables node 1(230) to load. Buffer 2 also enables test data to be transferred from node 1 to Tx/Rx buffer 1 through communication cable. Tx/Rx buffers 3,4,5(224,226,228) receive and store test data transmitted by nodes 2,3,4(232,234,236) through communication loop back cable(252) and enables nodes 2,3,4 to load. Routing controller(240) receives node 1's test data through D-BUS, processor's address and the address of the processor that connects to a node is determined, and test data is transmitted to D-BUS through nodes 1,2,3,4. The feed back of test data to the node is transferred under control to node 1 through D-BUS.
申请公布号 KR20000046103(A) 申请公布日期 2000.07.25
申请号 KR19980062779 申请日期 1998.12.31
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 MUN, TAE HYEON;LEE, HUN JU
分类号 G06F11/22;(IPC1-7):G06F11/22 主分类号 G06F11/22
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